by U.S. Dept. of Commerce, National Oceanic and Atmospheric Administration, Environmental Research Laboratories, Atlantic Oceanographic and Meteorological Laboratory in Miami, Fla .
Written in English
|Other titles||Expert system for quality control and feature recognition of oceanographic data from the open ocean|
|Statement||James C. Hendee|
|Series||NOAA technical memorandum ERL AOML -- 87|
|Contributions||Atlantic Oceanographic and Meteorological Laboratories|
|The Physical Object|
|Pagination||iii, 63 p.|
|Number of Pages||63|
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